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llvm-mirror/test/CodeGen/ARM/2012-08-09-neon-extload.ll

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Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; RUN: llc -mtriple=armv7-none-linux-gnueabi < %s | FileCheck %s
@var_v2i8 = global <2 x i8> zeroinitializer
@var_v4i8 = global <4 x i8> zeroinitializer
@var_v2i16 = global <2 x i16> zeroinitializer
@var_v4i16 = global <4 x i16> zeroinitializer
@var_v2i32 = global <2 x i32> zeroinitializer
@var_v4i32 = global <4 x i32> zeroinitializer
@var_v2i64 = global <2 x i64> zeroinitializer
define void @test_v2i8tov2i32() {
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion. This was done with the following sed invocation to catch label lines demarking function boundaries: sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct. llvm-svn: 186258
2013-07-13 22:38:47 +02:00
; CHECK-LABEL: test_v2i8tov2i32:
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
%i8val = load <2 x i8>* @var_v2i8
%i32val = sext <2 x i8> %i8val to <2 x i32>
store <2 x i32> %i32val, <2 x i32>* @var_v2i32
Make ARMAsmPrinter generate the correct alignment specifier syntax in instructions. The Printer will now print instructions with the correct alignment specifier syntax, like vld1.8 {d16}, [r0:64] llvm-svn: 175884
2013-02-22 11:01:33 +01:00
; CHECK: vld1.16 {d[[LOAD:[0-9]+]][0]}, [{{r[0-9]+}}:16]
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; CHECK: vmovl.s8 {{q[0-9]+}}, d[[LOAD]]
; CHECK: vmovl.s16 {{q[0-9]+}}, {{d[0-9]+}}
ret void
}
define void @test_v2i8tov2i64() {
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion. This was done with the following sed invocation to catch label lines demarking function boundaries: sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct. llvm-svn: 186258
2013-07-13 22:38:47 +02:00
; CHECK-LABEL: test_v2i8tov2i64:
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
%i8val = load <2 x i8>* @var_v2i8
%i64val = sext <2 x i8> %i8val to <2 x i64>
store <2 x i64> %i64val, <2 x i64>* @var_v2i64
Make ARMAsmPrinter generate the correct alignment specifier syntax in instructions. The Printer will now print instructions with the correct alignment specifier syntax, like vld1.8 {d16}, [r0:64] llvm-svn: 175884
2013-02-22 11:01:33 +01:00
; CHECK: vld1.16 {d{{[0-9]+}}[0]}, [{{r[0-9]+}}:16]
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; CHECK: vmovl.s8 {{q[0-9]+}}, d[[LOAD]]
; CHECK: vmovl.s16 {{q[0-9]+}}, {{d[0-9]+}}
; CHECK: vmovl.s32 {{q[0-9]+}}, {{d[0-9]+}}
; %i64val = sext <2 x i8> %i8val to <2 x i64>
; store <2 x i64> %i64val, <2 x i64>* @var_v2i64
ret void
}
define void @test_v4i8tov4i16() {
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion. This was done with the following sed invocation to catch label lines demarking function boundaries: sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct. llvm-svn: 186258
2013-07-13 22:38:47 +02:00
; CHECK-LABEL: test_v4i8tov4i16:
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
%i8val = load <4 x i8>* @var_v4i8
%i16val = sext <4 x i8> %i8val to <4 x i16>
store <4 x i16> %i16val, <4 x i16>* @var_v4i16
Make ARMAsmPrinter generate the correct alignment specifier syntax in instructions. The Printer will now print instructions with the correct alignment specifier syntax, like vld1.8 {d16}, [r0:64] llvm-svn: 175884
2013-02-22 11:01:33 +01:00
; CHECK: vld1.32 {d[[LOAD:[0-9]+]][0]}, [{{r[0-9]+}}:32]
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; CHECK: vmovl.s8 {{q[0-9]+}}, d[[LOAD]]
; CHECK-NOT: vmovl.s16
ret void
; CHECK: bx lr
}
define void @test_v4i8tov4i32() {
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion. This was done with the following sed invocation to catch label lines demarking function boundaries: sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct. llvm-svn: 186258
2013-07-13 22:38:47 +02:00
; CHECK-LABEL: test_v4i8tov4i32:
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
%i8val = load <4 x i8>* @var_v4i8
%i16val = sext <4 x i8> %i8val to <4 x i32>
store <4 x i32> %i16val, <4 x i32>* @var_v4i32
Make ARMAsmPrinter generate the correct alignment specifier syntax in instructions. The Printer will now print instructions with the correct alignment specifier syntax, like vld1.8 {d16}, [r0:64] llvm-svn: 175884
2013-02-22 11:01:33 +01:00
; CHECK: vld1.32 {d[[LOAD:[0-9]+]][0]}, [{{r[0-9]+}}:32]
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; CHECK: vmovl.s8 {{q[0-9]+}}, d[[LOAD]]
; CHECK: vmovl.s16 {{q[0-9]+}}, {{d[0-9]+}}
ret void
}
define void @test_v2i16tov2i32() {
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion. This was done with the following sed invocation to catch label lines demarking function boundaries: sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct. llvm-svn: 186258
2013-07-13 22:38:47 +02:00
; CHECK-LABEL: test_v2i16tov2i32:
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
%i16val = load <2 x i16>* @var_v2i16
%i32val = sext <2 x i16> %i16val to <2 x i32>
store <2 x i32> %i32val, <2 x i32>* @var_v2i32
Make ARMAsmPrinter generate the correct alignment specifier syntax in instructions. The Printer will now print instructions with the correct alignment specifier syntax, like vld1.8 {d16}, [r0:64] llvm-svn: 175884
2013-02-22 11:01:33 +01:00
; CHECK: vld1.32 {d[[LOAD:[0-9]+]][0]}, [{{r[0-9]+}}:32]
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; CHECK: vmovl.s16 {{q[0-9]+}}, d[[LOAD]]
; CHECK-NOT: vmovl
ret void
; CHECK: bx lr
}
define void @test_v2i16tov2i64() {
Convert CodeGen/*/*.ll tests to use the new CHECK-LABEL for easier debugging. No functionality change and all tests pass after conversion. This was done with the following sed invocation to catch label lines demarking function boundaries: sed -i '' "s/^;\( *\)\([A-Z0-9_]*\):\( *\)test\([A-Za-z0-9_-]*\):\( *\)$/;\1\2-LABEL:\3test\4:\5/g" test/CodeGen/*/*.ll which was written conservatively to avoid false positives rather than false negatives. I scanned through all the changes and everything looks correct. llvm-svn: 186258
2013-07-13 22:38:47 +02:00
; CHECK-LABEL: test_v2i16tov2i64:
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
%i16val = load <2 x i16>* @var_v2i16
%i64val = sext <2 x i16> %i16val to <2 x i64>
store <2 x i64> %i64val, <2 x i64>* @var_v2i64
Make ARMAsmPrinter generate the correct alignment specifier syntax in instructions. The Printer will now print instructions with the correct alignment specifier syntax, like vld1.8 {d16}, [r0:64] llvm-svn: 175884
2013-02-22 11:01:33 +01:00
; CHECK: vld1.32 {d[[LOAD:[0-9]+]][0]}, [{{r[0-9]+}}:32]
Add test for previous commit correcting NEON load patterns. llvm-svn: 161750
2012-08-13 12:38:45 +02:00
; CHECK: vmovl.s16 {{q[0-9]+}}, d[[LOAD]]
; CHECK: vmovl.s32 {{q[0-9]+}}, d[[LOAD]]
ret void
}
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