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[ARM] Mark some tests as not safe for -debugify-and-strip-all, NFC
These tests contain debug instructions which get checked, so we can't insert synthetic debug info and expect the tests to pass. The rest of the ARM backend tests appear to be fair game.
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# RUN: llc -mtriple arm-- -run-pass=regbankselect %s -o - | FileCheck %s
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# RUN: llc -mtriple thumbv7-- -run-pass=regbankselect %s -o - | FileCheck %s
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# RUN: llc -debugify-and-strip-all-safe=0 -mtriple arm-- -run-pass=regbankselect %s -o - | FileCheck %s
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# RUN: llc -debugify-and-strip-all-safe=0 -mtriple thumbv7-- -run-pass=regbankselect %s -o - | FileCheck %s
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--- |
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define void @test_add_s32() { ret void }
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define void @test_sub_s32() { ret void }
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@ -1,4 +1,4 @@
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; RUN: llc -mtriple armv7 %s -stop-before=livedebugvalues -o - | FileCheck %s
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; RUN: llc -debugify-and-strip-all-safe=0 -mtriple armv7 %s -stop-before=livedebugvalues -o - | FileCheck %s
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define <4 x i8> @i(<4 x i8>*, <4 x i8>) !dbg !8 {
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%3 = load <4 x i8>, <4 x i8>* %0, align 4, !dbg !14
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@ -1,4 +1,4 @@
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; RUN: llc -mtriple armv7 %s -stop-before=livedebugvalues -o - | FileCheck %s
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; RUN: llc -debugify-and-strip-all-safe=0 -mtriple armv7 %s -stop-before=livedebugvalues -o - | FileCheck %s
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define <4 x i8> @i(<4 x i8>*, <4 x i8>) !dbg !8 {
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%3 = load <4 x i8>, <4 x i8>* %0, align 4, !dbg !14
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