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[InstCombine] add icmp tests with extra uses; NFC

llvm-svn: 371939
This commit is contained in:
Sanjay Patel 2019-09-15 20:13:27 +00:00
parent 23811f1145
commit b3a2780d32

View File

@ -556,6 +556,23 @@ define i1 @test27(i32 %x, i32 %y, i32 %z) {
ret i1 %c
}
define i1 @test27_extra_uses(i32 %x, i32 %y, i32 %z) {
; CHECK-LABEL: @test27_extra_uses(
; CHECK-NEXT: [[LHS:%.*]] = sub nsw i32 [[X:%.*]], [[Z:%.*]]
; CHECK-NEXT: call void @foo(i32 [[LHS]])
; CHECK-NEXT: [[RHS:%.*]] = sub nsw i32 [[Y:%.*]], [[Z]]
; CHECK-NEXT: call void @foo(i32 [[RHS]])
; CHECK-NEXT: [[C:%.*]] = icmp sgt i32 [[LHS]], [[RHS]]
; CHECK-NEXT: ret i1 [[C]]
;
%lhs = sub nsw i32 %x, %z
call void @foo(i32 %lhs)
%rhs = sub nsw i32 %y, %z
call void @foo(i32 %rhs)
%c = icmp sgt i32 %lhs, %rhs
ret i1 %c
}
; X - Z > Y - Z -> X > Y if there is no overflow.
define i1 @test28(i32 %x, i32 %y, i32 %z) {
; CHECK-LABEL: @test28(
@ -568,6 +585,23 @@ define i1 @test28(i32 %x, i32 %y, i32 %z) {
ret i1 %c
}
define i1 @test28_extra_uses(i32 %x, i32 %y, i32 %z) {
; CHECK-LABEL: @test28_extra_uses(
; CHECK-NEXT: [[LHS:%.*]] = sub nuw i32 [[X:%.*]], [[Z:%.*]]
; CHECK-NEXT: call void @foo(i32 [[LHS]])
; CHECK-NEXT: [[RHS:%.*]] = sub nuw i32 [[Y:%.*]], [[Z]]
; CHECK-NEXT: call void @foo(i32 [[RHS]])
; CHECK-NEXT: [[C:%.*]] = icmp ugt i32 [[LHS]], [[RHS]]
; CHECK-NEXT: ret i1 [[C]]
;
%lhs = sub nuw i32 %x, %z
call void @foo(i32 %lhs)
%rhs = sub nuw i32 %y, %z
call void @foo(i32 %rhs)
%c = icmp ugt i32 %lhs, %rhs
ret i1 %c
}
; X + Y > X -> Y > 0 if there is no overflow.
define i1 @test29(i32 %x, i32 %y) {
; CHECK-LABEL: @test29(