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remove a useless xfailed test.

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llvm-svn: 46400
This commit is contained in:
Chris Lattner 2008-01-26 19:35:46 +00:00
parent 9fae964ef7
commit f0c3240135
1 changed files with 0 additions and 27 deletions
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27
test/CodeGen/X86/2007-08-10-LEA16Use32.ll
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@ -1,27 +0,0 @@
; RUN: llvm-as < %s | llc -march=x86 | grep {leal}
; XFAIL: *
; This test is XFAIL'd because strength-reduction was improved to
; avoid emitting the lea, so it longer tests whether the 16-bit
; lea is avoided.
@X = global i16 0 ; <i16*> [#uses=1]
@Y = global i16 0 ; <i16*> [#uses=1]
define void @_Z3fooi(i32 %N) {
entry:
%tmp1019 = icmp sgt i32 %N, 0 ; <i1> [#uses=1]
br i1 %tmp1019, label %bb, label %return
bb: ; preds = %bb, %entry
%i.014.0 = phi i32 [ 0, %entry ], [ %indvar.next, %bb ] ; <i32> [#uses=2]
%tmp1 = trunc i32 %i.014.0 to i16 ; <i16> [#uses=2]
volatile store i16 %tmp1, i16* @X, align 2
%tmp34 = shl i16 %tmp1, 2 ; <i16> [#uses=1]
volatile store i16 %tmp34, i16* @Y, align 2
%indvar.next = add i32 %i.014.0, 1 ; <i32> [#uses=2]
%exitcond = icmp eq i32 %indvar.next, %N ; <i1> [#uses=1]
br i1 %exitcond, label %return, label %bb
return: ; preds = %bb, %entry
ret void
}