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4e074494e8
This commit updates the existing SelectionDAG tests for the stackmap and patchpoint intrinsics and enables FastISel testing. It also splits up the tests into separate files, due to different codegen between SelectionDAG and FastISel. llvm-svn: 214382
19 lines
834 B
LLVM
19 lines
834 B
LLVM
; RUN: llc -mtriple=arm64-apple-darwin -enable-misched=0 -mcpu=cyclone < %s | FileCheck %s
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; Test that scratch registers are spilled around patchpoints
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; CHECK: InlineAsm End
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; CHECK-NEXT: mov x{{[0-9]+}}, x16
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; CHECK-NEXT: mov x{{[0-9]+}}, x17
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; CHECK-NEXT: Ltmp
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; CHECK-NEXT: nop
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define void @clobberScratch(i32* %p) {
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%v = load i32* %p
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tail call void asm sideeffect "nop", "~{x0},~{x1},~{x2},~{x3},~{x4},~{x5},~{x6},~{x7},~{x8},~{x9},~{x10},~{x11},~{x12},~{x13},~{x14},~{x15},~{x18},~{x19},~{x20},~{x21},~{x22},~{x23},~{x24},~{x25},~{x26},~{x27},~{x28},~{x29},~{x30},~{x31}"() nounwind
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tail call void (i64, i32, i8*, i32, ...)* @llvm.experimental.patchpoint.void(i64 5, i32 20, i8* null, i32 0, i32* %p, i32 %v)
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store i32 %v, i32* %p
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ret void
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}
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declare void @llvm.experimental.patchpoint.void(i64, i32, i8*, i32, ...)
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