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11d48d6932
Upgrade to use new Tcl exec based test harness. This exposes 3 bugs that were previously not being reported: test/Transforms/GlobalDCE/2002-08-17-FunctionDGE.ll test/Transforms/GlobalOpt/memset.ll test/Transforms/IndVarsSimplify/exit_value_tests.llx llvm-svn: 36065
25 lines
456 B
LLVM
25 lines
456 B
LLVM
; RUN: llvm-as < %s | opt -ipsccp | llvm-dis | grep -v {ret i512 undef} | \
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; RUN: grep {ret i8 2}
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define internal i512 @test(i1 %B) {
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br i1 %B, label %BB1, label %BB2
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BB1:
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%Val = add i512 0, 1
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br label %BB3
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BB2:
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br label %BB3
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BB3:
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%Ret = phi i512 [%Val, %BB1], [2, %BB2]
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ret i512 %Ret
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}
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define i8 @caller()
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{
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%t1 = and i2 2, 1
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%t11 = trunc i2 %t1 to i1
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%t2 = call i512 @test(i1 %t11)
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%t3 = trunc i512 %t2 to i8
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ret i8 %t3
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}
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