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There is a bunch of similar bitfield extraction code throughout *ISelDAGToDAG. E.g, ARMISelDAGToDAG, AArch64ISelDAGToDAG, and AMDGPUISelDAGToDAG all contain code that matches a bitfield extract from an and + right shift. Rather than duplicating code in the same way, this adds two opcodes: - G_UBFX (unsigned bitfield extract) - G_SBFX (signed bitfield extract) They work like this ``` %x = G_UBFX %y, %lsb, %width ``` Where `lsb` and `width` are - The least-significant bit of the extraction - The width of the extraction This will extract `width` bits from `%y`, starting at `lsb`. G_UBFX zero-extends the result, while G_SBFX sign-extends the result. This should allow us to use the combiner to match the bitfield extraction patterns rather than duplicating pattern-matching code in each target. Differential Revision: https://reviews.llvm.org/D98464 |
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| .. | ||
| GlobalISel | ||
| AArch64SelectionDAGTest.cpp | ||
| AllocationOrderTest.cpp | ||
| AsmPrinterDwarfTest.cpp | ||
| CMakeLists.txt | ||
| DIEHashTest.cpp | ||
| DIETest.cpp | ||
| LexicalScopesTest.cpp | ||
| LowLevelTypeTest.cpp | ||
| MachineInstrBundleIteratorTest.cpp | ||
| MachineInstrTest.cpp | ||
| MachineOperandTest.cpp | ||
| MFCommon.inc | ||
| PassManagerTest.cpp | ||
| ScalableVectorMVTsTest.cpp | ||
| SelectionDAGAddressAnalysisTest.cpp | ||
| TargetOptionsTest.cpp | ||
| TestAsmPrinter.cpp | ||
| TestAsmPrinter.h | ||
| TypeTraitsTest.cpp | ||