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ab043ff680
Essentially the same as the GEP change in r230786.
A similar migration script can be used to update test cases, though a few more
test case improvements/changes were required this time around: (r229269-r229278)
import fileinput
import sys
import re
pat = re.compile(r"((?:=|:|^)\s*load (?:atomic )?(?:volatile )?(.*?))(| addrspace\(\d+\) *)\*($| *(?:%|@|null|undef|blockaddress|getelementptr|addrspacecast|bitcast|inttoptr|\[\[[a-zA-Z]|\{\{).*$)")
for line in sys.stdin:
sys.stdout.write(re.sub(pat, r"\1, \2\3*\4", line))
Reviewers: rafael, dexonsmith, grosser
Differential Revision: http://reviews.llvm.org/D7649
llvm-svn: 230794
19 lines
839 B
LLVM
19 lines
839 B
LLVM
; RUN: llc -mtriple=arm64-apple-darwin -enable-misched=0 -mcpu=cyclone < %s | FileCheck %s
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; Test that scratch registers are spilled around patchpoints
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; CHECK: InlineAsm End
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; CHECK-NEXT: mov x{{[0-9]+}}, x16
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; CHECK-NEXT: mov x{{[0-9]+}}, x17
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; CHECK-NEXT: Ltmp
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; CHECK-NEXT: nop
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define void @clobberScratch(i32* %p) {
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%v = load i32, i32* %p
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tail call void asm sideeffect "nop", "~{x0},~{x1},~{x2},~{x3},~{x4},~{x5},~{x6},~{x7},~{x8},~{x9},~{x10},~{x11},~{x12},~{x13},~{x14},~{x15},~{x18},~{x19},~{x20},~{x21},~{x22},~{x23},~{x24},~{x25},~{x26},~{x27},~{x28},~{x29},~{x30},~{x31}"() nounwind
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tail call void (i64, i32, i8*, i32, ...)* @llvm.experimental.patchpoint.void(i64 5, i32 20, i8* null, i32 0, i32* %p, i32 %v)
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store i32 %v, i32* %p
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ret void
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}
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declare void @llvm.experimental.patchpoint.void(i64, i32, i8*, i32, ...)
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